For the physical characterization of particles Microtrac offers a range of optical particle analyzers. Microtrac is the only worldwide supplier of dynamic image analysis, static image analysis, laser diffraction and sieve analysis equipment with an extensive understanding of the strengths and weaknesses of each method.
|Dynamic ImageAnalysis (DIA)||Static ImageAnalysis||Sieve Analysis(Retsch)||Laser Diffraction||Dynamic LightScattering (DLS)|
|Wide dynamic measurement range|
|Reproducibility and repeatability|
|High resolution for narrow distributions|
|Particle shape analysis|
|Direct measurement technique|
|Reliable detection of oversized grains|
|Robust hardware,easy operation for routine analysis|
|Analysis of individual particles|
|High measurement speed,short measurement times|
|Analysis of nano particles|
|Analysis of Zeta potentialand molecular weight|
|Measuring range||0.8 µm - 135 mm||0.5 µm – 1.5 mm||10 µm - 125 mm||10 nm – 5 mm||0.8 nm - 6500 nm|
Microtrac particle characterization instruments are used by top industry professionals to conduct the following analysis:
Whether you are new to the industry or a seasoned veteran, we can help you find a solution to fit your specific needs at Microtrac.
Microtrac announced a new instrument at Pittcon 2018! The new Microtrac Sync will provide customers with more information about their particles than ever before. By integrating the world’s leading laser diffraction technology with the leading dynamic image analysis on the same bench with the same GUI, Microtrac’s Sync is synchronizing size and shape measurement – one sample, one bench, one sample flow path, one sample cell, one analysis. Size alone is not good enough anymore.
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